OLYMPUS OPTICAL MEASUREMENT DEVICE - 龍翩真空科技股份有限公司--真空鍍膜機、光學鍍膜、電子槍、超低溫冷凍機、USPM

Near-infrared spectroscopic microscopy analyzer

380nm ~ 1050nm from visible light to near-infrared spectroscopic measurement achieve a wide range of wavelength region,

Near-infrared spectroscopic analyzer microscopic USPM-RU-W can be finely high-speed & visible light region to the near-infrared region of wide wavelength spectroscopic measurement.

Since it can be readily determined by a spectrophotometer fine region typically can not be measured, the reflectance of the surface, is ideal for a minute optical element and electronic parts and other products.

Lens reflectance measuring machine

Lens reflectance measuring machine (USPM-RU III)

USPM-RU III reflectometer can accurately measure current can not be measured micro spectrometer, the spectral reflectance of the reflection thin samples, not the back of the sample light interference. It is the most suitable for measuring the surface reflectance, film evaluation, minute parts of the reflectivity measurement system.

Feature：

USPM-RUⅢ is developed on original instruments USPM-RU generation product, is a new type of lens reflectance measuring instrument. Thinner the lens rear surface is not affected by the reflected light, can achieve high-speed, high-precision spectroscopic measurement.

Application：

Elimination of the back reflected light
Short measurement time
High strength can be measured film thickness
It can measure the reflectance of the minute regions
Support XY chromaticity diagram, L * a * b * measurement

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